About the Measure
| Domains | Motivation, goal orientation and perseverance, Perceptions of Self, Social and Emotional Competence |
| Key stages | Key Stage 3, Key Stage 4 |
| Subscales | Self-reliance; Self-esteem; Goal-directed; Competitiveness; power; Recognition; token rewards; Social concern; Affiliation; Task involvement; Striving for excellence |
| Description | This instrument's 11 subscales reflect the 11 dimensons of the Maehr model (McInerney & Sinclair, 1991). |
| Example | Praise from my parents for good schoolwork is important to me |
| Link | http://journals.sagepub.com/doi/pdf/10.1177/0022022192233009 |
| Psychometry | |
| Implementation |
Implementation details
| No. of items | 30 |
| Format | Likert |
| Respondent | Self |
| Scoring | Standardised |
| Time | 0 |
| Age | 12-16 |
| Cost single purchase | Free - Available |
| Cost per child | Free - Available |
Psychometric details
| UK norms | No |
| Cronbach's α | .44-.95 |
| Test retest | Not reported |
| Inter-rater reliability | Not reported |
| EFA | 10-factor orthog |
| CFA | 8 factors with correlated uniqueness: Chi-square(659)= 2568.62 TLI= .903 RNI= .914 GFI= 932. 8 factors without correlated uniqueness: Chi-square(674)= 3414.57 TLI= .864 RNI= .876 GFI= .909 |
| Criterion validity | Not reported |
| Construct validity | Not reported |
| Concurrent validity | Not reported |
| Predictive validity | McInerney & Sinclair correctly predicted school leaving after year 10 through the Inventory of School Motivation for 70% of Aboriginal students, 72% Anglo students and 63% Migrant students. |
| Responsiveness | Not reported |
| Floor/Ceiling | Not reported |
| References | McInerney, D. M., & Sinclair, K. E. (1992). Dimensions of School Motivation: A cross-cultural validation study. Journal of Cross-Cultural Psychology, 23(3), 389-406. doi:10.1177/0022022192233009 McInerney, D. M., Yeung, A. S., & McInerney, V. (2000). Cross-cultural validation of the Inventory of School Motivation (ISM): Motivation Orientations of Navajo and Anglo students. Journal of Applied Measurement, 2(2), 135-153. |